Jeff has been an Account Manager and Business Developer for over 30 years. He has a strong technical background (Ph.D. in Analytical Chemistry) and over thirty years of sales experience in computer-based measurement and automation. He has honed his skills in team selling and developed vertical expertise in sound & vibration, structural health monitoring, and machine vision applications. Prior to joining Averna powered by Spherea, he was responsible for the account management
Design for Test (DFT) plays a critical role in successful device validation and scalable manufacturing but common oversights introduce unnecessary risk and cost.
This session examines five frequent DFT mistakes:
Through practical examples, attendees will learn how early and intentional test strategy decisions improve flexibility, reduce validation delays, and support longterm manufacturing efficiency.
Get actionable guidance to help teams integrate DFT thinking earlier in the development lifecycle and avoid pitfalls that hinder product readiness and scalability.